DNA deformations near charged surfaces : electron and atomic force microscopy
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چکیده
منابع مشابه
DNA deformations near charged surfaces: electron and atomic force microscopy views.
DNA is a very important cell structural element, which determines the level of expression of genes by virtue of its interaction with regulatory proteins. We use electron (EM) and atomic force microscopy (AFM) to characterize the flexibility of double-stranded DNA ( approximately 150-950 nm long) close to a charged surface. Automated procedures for the extraction of DNA contours ( approximately ...
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